HOME > Publications
 
ÀÛ¼ºÀÏ : 15-01-20 18:15
2007
 ±Û¾´ÀÌ : Master
Á¶È¸ : 1,888  
Measurement and estimation of temperature rise in TEM sample during ion milling, Y. M. Park, D. S. Ko, K. W. Yi, I. Petrov, and Y. W. Kim,  Ultramicroscopy 107 (8), 663 (2007).

 
   
 

¼­¿ï½Ã °ü¾Ç±¸ °ü¾Ç·Î1 ¼­¿ï´ëÇб³ 31µ¿ 411È£
½Ç½Ã°£°üÂûÀüÀÚÇö¹Ì°æ ¿¬±¸½Ç
Tel : 02-878-5010  |  Fax : 02-878-5010
COPYRIGHT 2014. ALL RIGHT RESERVED  
In-situ Electron Microscopy Laboratory
31-411 Dept. of Materials Science and Engineering
Seoul National University
Gwanak-ro1 Gwanak-gu Seoul, Republic of Korea
Äü¸Þ´º