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ÀÛ¼ºÀÏ : 15-01-20 18:20
2008
 ±Û¾´ÀÌ : Master
Á¶È¸ : 1,515  
Analysis of interface layers by spectroscopic ellipsometry, T. J. Kim, J. J. Yoon, Y. D. Kim, D. E. Aspnes, M. V. Klein, D. S. Ko, Y. W. Kim, V. C. Elarde, and J. J. Coleman,  Appl Surf Sci 255 (3), 640 (2008).

 
   
 

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In-situ Electron Microscopy Laboratory
31-411 Dept. of Materials Science and Engineering
Seoul National University
Gwanak-ro1 Gwanak-gu Seoul, Republic of Korea
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