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Total 113
No. Contents Date
109
In situ observations of transgranular crack propagation in high-manganese steel., S. I. Baik, T. Y. Ahn, W. P. Hong, Y. S. Jung, Y. K. Lee and Y. W. Kim, Scripta Mater , 100, 32-35.(2015)
07-13
110
V-pits as Barriers to Diffusion of Carriers in InGaN/GaN 
Quantum Wells
.,
 M. H. SheenS. D. KimJ. 
H. Lee, J. I. Shim, and Y. W. Kim, JEM , 44 (11), 4134-4138.(2015)
09-30
111
Interface characteristics of spin-on-dielectric SiOx-buffered passivation 
layers for AlGaN/GaN high electron mobility transistors
.,
 P. S. KoK. S. ParkY. C. Yoon, 
M. H. Sheen, and S. D. Kim, Thin Solid Films , 589, 838-843.(2015)
09-30
112
In situ liquid-cell transmission electron microscopy 
for direct observation of concentration-dependent 
growth and dissolution of silver nanoparticles†
., T. Y. Ahn, S. P. Hong, S. I. Kim and Y. W. Kim
RSC Advances, 5, 82342–82345.(2015)
09-30
113
The impact of atomic layer deposited SiO2 passivation for high-k Ta1-xZrxO on the InP substrate., C. Mahata, I. K. Oh, C. M. Yoon, C. W. Lee, J. m. Seo, H. Algadi, M. H. Sheen, Y. W. KimH. j. Kim and T. Y. Lee, Journal of Materials Chemistry C, 39 (3), 10293-10301.(2015)
12-31
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In-situ Electron Microscopy Laboratory
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